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      相控陣檢測

      產品詳細介紹


      超聲相控陣是超聲探頭晶片的組合,由多個壓電晶片按一定的規律分布排列,然后逐次按預先規定的延遲時間激發各個晶片,所有晶片發射的超聲波形成一個整體波陣面,能有效地控制發射超聲束(波陣面)的形狀和方向,能實現超聲波的波束掃描、偏轉和聚焦。它為確定不連續性的形狀、大小和方向提供出比單個或多個探頭系統更大的能力。
      超聲相控陣檢測技術使用不同形狀的多陣元換能器產生和接收超聲波束,通過控制換能器陣列中各陣元發射(或接收)脈沖的不同延遲時間,改變聲波到達(或來自)物體內某點時的相位關系,實現焦點和聲束方向的變化,從而實現超聲波的波束掃描、偏轉和聚焦。然后采用機械掃描和電子掃描相結合的方法來實現圖像成像。通常使用的是一維線形陣列探頭,壓電晶片呈直線狀排列,聚焦聲場為片狀,能夠得到缺陷的二維圖像,在工業中得到廣泛的應用。


      PAUT TEST/Examination

      Phased Array Ultrasonic Testing (PAUT) is an advanced nondestructive examination technique that utilizes a set of ultrasonic testing (UT) probes made up of numerous small elements, each of which is pulsed individually with computer-calculated timing. This technique can be used to inspect more complex geometries that are difficult and much slower to inspect with single probes. PAUT can be used to inspect almost any material where traditional UT methods have been utilized, and is often used for weld inspections and crack detection.

      Compared to other forms of UT, PAUT has several advantages. PAUT can be conducted more quickly than other forms of UT, often within a fraction of a second. It can easily be used for repeat scans because it has a high degree of repeatability. By emitting beams of multiple different angles sequentially, PAUT is able to create detailed and accurate cross-sections of a part. It is also particularly useful in situations where there is less room for mechanical scanning because it’s able to sweep the beam without moving the probe.





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